Searched refs:TEST_FUNC_NUM (Results 1 – 3 of 3) sorted by relevance
23 #define TEST_FUNC_NUM 1 macro28 #define TEST_FUNC_NUM 1 macro63 const uint32_t addr = TEST_SDIO_BASE_ADDR * TEST_FUNC_NUM + TEST_ADDR_OFFSET + TEST_ADDR_ADD; in TestSdioIncrAddrReadAndWriteOtherBytes()86 addr = TEST_SDIO_BASE_ADDR * TEST_FUNC_NUM + TEST_ADDR_OFFSET; in TestSdioIncrAddrReadAndWriteOneByte()146 const uint32_t addr = TEST_SDIO_BASE_ADDR * TEST_FUNC_NUM + TEST_FIXED_OFFSET + TEST_ADDR_ADD; in TestSdioFixedAddrReadAndWriteOtherBytes()171 addr = TEST_SDIO_BASE_ADDR * TEST_FUNC_NUM + TEST_FIXED_OFFSET; in TestSdioFixedAddrReadAndWriteOneByte()
539 #define TEST_FUNC_NUM 1 /* 本测试用例中，使用编号为1的I/O function */591 addr = TEST_FBR_BASE_ADDR * TEST_FUNC_NUM + TEST_ADDR_OFFSET;
933 #define TEST_FUNC_NUM 1 /* The I/O function whose ID is 1 is used. */985 addr = TEST_FBR_BASE_ADDR * TEST_FUNC_NUM + TEST_ADDR_OFFSET;